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Considerations for interpretation of luminescence...
Journal article

Considerations for interpretation of luminescence from silicon-on-insulator light emitting structures

Abstract

Silicon-based, light emitting diodes (LEDs) and light emitting structures without electrical contacts have been integrated on silicon-on-insulator (SOI) wafers. The room temperature characterization of these samples using electro- and photo-luminescence is described. All samples emit at 1150 nm near the band-edge of Si, and samples that receive Er implantation emit additionally at a band centered at 1550 nm. Photoluminescence from the SOI …

Authors

Milgram JN; Knights AP; Homewood KP; Gwilliam RM

Journal

Semiconductor Science and Technology, Vol. 22, No. 10,

Publisher

IOP Publishing

Publication Date

October 1, 2007

DOI

10.1088/0268-1242/22/10/005

ISSN

0268-1242