Journal article
Locating La atoms in epitaxial Bi3.25La0.75Ti3O12 films through atomic resolution electron energy loss spectroscopy mapping
Abstract
Atomic resolution high-angle annular dark-field imaging of La-doped bismuth titanate (BLT), Bi3.25La0.75Ti3O12, has been carried out with an aberration-corrected transmission electron microscope. The HAADF image revealed the presence of defects in the [Bi2O2]2+ layers and extra atomic rows between the [Bi2O2]2+ layers and the [Bi2Ti3O10]2− perovskite slabs. Electron energy loss spectroscopy elemental mapping at atomic resolution revealed the …
Authors
Gunawan L; Lazar S; Gautreau O; Harnagea C; Pignolet A; Botton GA
Journal
Applied Physics Letters, Vol. 95, No. 19,
Publisher
AIP Publishing
Publication Date
November 9, 2009
DOI
10.1063/1.3258491
ISSN
0003-6951