Journal article
Guest Editors' Introduction: Silicon Debug and Diagnosis
Abstract
Troubleshooting how and why circuits and systems fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for research and development, or just getting a working first prototype. This detective work is, however, very tricky. Sources of difficulty include circuit and system complexity, packaging, limited …
Authors
Nicolici N; Benware B
Journal
IEEE Design and Test, Vol. 30, No. 4, pp. 6–7
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
August 11, 2013
DOI
10.1109/mdat.2013.2279324
ISSN
2168-2356