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Guest Editors' Introduction: Silicon Debug and...
Journal article

Guest Editors' Introduction: Silicon Debug and Diagnosis

Abstract

Troubleshooting how and why circuits and systems fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for research and development, or just getting a working first prototype. This detective work is, however, very tricky. Sources of difficulty include circuit and system complexity, packaging, limited …

Authors

Nicolici N; Benware B

Journal

IEEE Design and Test, Vol. 30, No. 4, pp. 6–7

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

August 11, 2013

DOI

10.1109/mdat.2013.2279324

ISSN

2168-2356

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