Guest Editors' Introduction: Silicon Debug and Diagnosis

Troubleshooting how and why circuits and systems fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for research and development, or just getting a working first prototype. This detective work is, however, very tricky. Sources of difficulty include circuit and system complexity, packaging, limited physical access, shortened product creation cycle, and time to market. New and efficient solutions for debug and diagnosis have a much needed and highly visible impact on productivity.