Journal article
Automated Selection of Assertions for Bit-Flip Detection During Post-Silicon Validation
Abstract
Post-silicon validation deals with detection and diagnosis of errors that, due to existing limitations in pre-silicon verification, escape to the silicon prototypes and need to be fixed before committing to high-volume manufacturing. Electrical errors, such as those caused by cross-talk or power droops, are particularly difficult to catch during the pre-silicon phase because of the insufficient accuracy of device models, which is often …
Authors
Taatizadeh P; Nicolici N
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 35, No. 12, pp. 2118–2130
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2016
DOI
10.1109/tcad.2016.2538087
ISSN
0278-0070