Journal article
On-Chip Cube-Based Constrained-Random Stimuli Generation for Post-Silicon Validation
Abstract
Post-silicon validation is critical for exposing subtle design errors that have escaped to the silicon prototypes. Its effectiveness is conditioned by in-system application of a large volume of functionally-compliant stimuli. In this paper, we present a methodology to design constrained-random stimuli generators, which are placed on-chip and are configurable at design-time to generate in-system functionally-compliant stimuli subject to …
Authors
Shi X; Nicolici N
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 35, No. 6, pp. 1012–1025
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2016
DOI
10.1109/tcad.2015.2481874
ISSN
0278-0070