Sample positioner and deflection energy analyzer for measurements of photofield emission

A sample positioner and an electron energy analyzer for studies of photofield emission have been designed and constructed. The sample positioner allows photofield emission from every facet of a field emitter to be measured under illumination at arbitrary angles of light incidence and polarization. The electrons emitted from a selected facet are decelerated to a kinetic energy E0 by a series of cylindrical lenses and introduced into either one …