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Deviations of 16O-induced K X-ray yields from Z12...
Journal article

Deviations of 16O-induced K X-ray yields from Z12 dependence

Abstract

A careful comparison of K X-ray yields produced by 64 MeV 16O ions and 4 MeV protons of identical velocity has been carried out with ±2% precision, using thin (∼ 10 nm) targets of Ti, Cr and Ag. The incident oxygen charge state was varied from 6+ to 8+. Since the path length for charge exchange in the K-shell of oxygen greatly exceeds our target thickness, the effective 16O charge state is essentially equal to its incident value. For the …

Authors

Tong SY; Davies JA; Forster JS; Haugen HK; Jackman TE; Lapicki G

Journal

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Vol. 119, No. 3, pp. 383–386

Publisher

Elsevier

Publication Date

November 1996

DOI

10.1016/0168-583x(96)00452-1

ISSN

0168-583X