Journal article
Measurement of birefringence in thin-film waveguides by Rayleigh scattering.
Abstract
A method of measuring birefringence in slab and ridge waveguides based on the coherent superposition of Rayleigh light scattering from TE and TM polarized modes is described and demonstrated in silica-on-silicon waveguides. A measurement accuracy of approximately 10(-6) has been achieved. This method is used to determine the evolution of waveguide birefringence with annealing temperature in phosphorous-doped glass waveguides. The measured …
Authors
Janz S; Cheben P; Dayan H; Deakos R
Journal
Optics Letters, Vol. 28, No. 19, pp. 1778–1780
Publisher
Optica Publishing Group
Publication Date
October 1, 2003
DOI
10.1364/ol.28.001778
ISSN
0146-9592