Journal article
Eliminating the birefringence in silicon-on-insulator ridge waveguides by use of cladding stress.
Abstract
We propose and demonstrate the use of the cladding stress-induced photoelastic effect to eliminate modal birefringence in silicon-on-insulator (SOI) ridge waveguides. Birefringence-free operation was achieved for waveguides with otherwise large birefringence by use of properly chosen thickness and stress of the upper cladding layer. With the stress levels typically found in cladding materials such as SiO2, the birefringence modification range …
Authors
Xu DX; Cheben P; Dalacu D; Delâge A; Janz S; Lamontagne B; Picard MJ; Ye WN
Journal
Optics Letters, Vol. 29, No. 20, pp. 2384–2386
Publisher
Optica Publishing Group
Publication Date
October 15, 2004
DOI
10.1364/ol.29.002384
ISSN
0146-9592