Journal article
Fully Integrated Single Photon Avalanche Diode Detector in Standard CMOS 0.18- $\mu$m Technology
Abstract
Avalanche photodiodes (APDs) operating in Geiger mode can detect weak optical signals at high speed. The implementation of APD systems in a CMOS technology makes it possible to integrate the photodetector and its peripheral circuits on the same chip. In this paper, we have fabricated APDs of different sizes and their driving circuits in a commercial 0.18-$\mu$m CMOS technology. The APDs are theoretically analyzed, measured, and the results are …
Authors
Faramarzpour N; Deen MJ; Shirani S; Fang Q
Journal
IEEE Transactions on Electron Devices, Vol. 55, No. 3, pp. 760–767
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2008
DOI
10.1109/ted.2007.914839
ISSN
0018-9383