Journal article
Substrate bias effects on drain-induced barrier lowering in short-channel PMOS devices
Abstract
It was found that, as the channel length decreased, the threshold voltage shift caused by drain-induced barrier lowering (DIBL) first increased with increasing substrate bias and then decreased as the channel length decreased further. The channel length (L/sub INT/) corresponding to an almost zero change of the DIBL variation with substrate bias was found to be between 0.78 and 0.90 mu m for the PMOS devices. This change in DIBL with substrate …
Authors
Deen MJ; Yan ZX
Journal
IEEE Transactions on Electron Devices, Vol. 37, No. 7, pp. 1707–1713
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
7 1990
DOI
10.1109/16.55758
ISSN
0018-9383