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Substrate bias effects on drain-induced barrier...
Journal article

Substrate bias effects on drain-induced barrier lowering in short-channel PMOS devices

Abstract

It was found that, as the channel length decreased, the threshold voltage shift caused by drain-induced barrier lowering (DIBL) first increased with increasing substrate bias and then decreased as the channel length decreased further. The channel length (L/sub INT/) corresponding to an almost zero change of the DIBL variation with substrate bias was found to be between 0.78 and 0.90 mu m for the PMOS devices. This change in DIBL with substrate …

Authors

Deen MJ; Yan ZX

Journal

IEEE Transactions on Electron Devices, Vol. 37, No. 7, pp. 1707–1713

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

7 1990

DOI

10.1109/16.55758

ISSN

0018-9383