Journal article
High-Frequency Noise of Modern MOSFETs: Compact Modeling and Measurement Issues
Abstract
Compact modeling of the most important high-frequency (HF) noise sources of the MOSFET is presented in this paper, along with challenges in noise measurement and deembedding of future CMOS technologies. Several channel thermal noise models are reviewed and their ability to predict the channel noise of extremely small devices is discussed. The impact of technology scaling on noise performance of MOSFETs is also investigated by means of …
Authors
Deen MJ; Chen C-H; Asgaran S; Rezvani GA; Tao J; Kiyota Y
Journal
IEEE Transactions on Electron Devices, Vol. 53, No. 9, pp. 2062–2081
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2006
DOI
10.1109/ted.2006.880370
ISSN
0018-9383