Journal article
Physically-based method for measuring the threshold voltage of MOSFETs
Authors
Yan ZX; Deen MJ
Journal
IEE Proceedings G Circuits Devices and Systems, Vol. 138, No. 3,
Publisher
Institution of Engineering and Technology (IET)
Publication Date
1991
DOI
10.1049/ip-g-2.1991.0060
ISSN
0956-3768