Journal article
Operational characteristics of CMOS op-amps at cryogenic temperatures
Abstract
Authors
Deen MJ
Journal
Solid-State Electronics, Vol. 31, No. 2, pp. 291–297
Publisher
Elsevier
Publication Date
February 1, 1988
DOI
10.1016/0038-1101(88)90145-1
ISSN
0038-1101