Journal article
A Scalable Meander-Line Resistor Model for Silicon RFICs
Abstract
Authors
Murji R; Deen MJ
Journal
IEEE Transactions on Electron Devices, Vol. 49, No. 1, pp. 187–190
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2002
DOI
10.1109/16.974769
ISSN
0018-9383