Journal article
Special Issue on Advanced Compact Models and 45-nm Modeling Challenges
Abstract
THIS Special Issue is devoted to research and development activities on emerging compact MOS models for advanced integrated circuit simulation using next is devoted to research and development activities on emerging compact MOS models for advanced integrated circuit simulation using nextMOS models for advanced integrated circuit simulation using next models for advanced integrated circuit simulation using next is devoted to research and …
Authors
Saha SK; Arora ND; Deen MJ; Miura-Mattausch M
Journal
IEEE Transactions on Electron Devices, Vol. 53, No. 9, pp. 1957–1960
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
September 1, 2006
DOI
10.1109/ted.2006.882387
ISSN
0018-9383