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Finding the asymmetric parasitic source and drain...
Journal article

Finding the asymmetric parasitic source and drain resistances from the a.c. conductances of a single MOS transistor

Abstract

Layout asymmetry, processing, or hot-carrier stressing can give rise to unequal source and drain parasitic resistances in a MOSFET. In these cases, it is necessary to extract these resistances separately without the aid of other transistors. In this paper, we present a simple method to extract the source and drain parasitic resistances separately. This method, unlike earlier ones that depend on the measurements of the d.c. resistances of …

Authors

Raychaudhuri A; Deen MJ; King MIH; Kolk J

Journal

Solid-State Electronics, Vol. 39, No. 6, pp. 909–913

Publisher

Elsevier

Publication Date

June 1996

DOI

10.1016/0038-1101(95)00269-3

ISSN

0038-1101