Transmission electron microscopy observations of debris structure in deformed copper single crystals

The debris component of the dislocation substructure in copper single crystals deformed at 78 K was studied by weak-beam transmission electron microscopy. The following defects were identified: primary unfaulted dipoles, faulted dipoles, stacking-fault tetrahedra and defect clusters. It is shown that all these defects can be derived from primary dislocations. The distribution of dipole sizes as a function of flow stress suggests that they are …