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On the contribution of vacancy complexes to the...
Journal article

On the contribution of vacancy complexes to the saturation of the carrier concentration in zinc doped InP

Abstract

Positron annihilation spectroscopy on Zn-doped InP has revealed the presence of a defect with a positron lifetime of ∼330 ps in samples in which the carrier concentration has saturated. This lifetime is attributed to a complex involving vacancies and Zn atoms. A model is proposed in which this complex has a (−/0) level near the bottom of the band gap, and undergoes a large inward lattice relaxation upon the transition to the neutral charge …

Authors

Mahony J; Mascher P; Puff W

Journal

Journal of Applied Physics, Vol. 80, No. 5, pp. 2712–2719

Publisher

AIP Publishing

Publication Date

September 1, 1996

DOI

10.1063/1.363188

ISSN

0021-8979