Journal article
On the contribution of vacancy complexes to the saturation of the carrier concentration in zinc doped InP
Abstract
Positron annihilation spectroscopy on Zn-doped InP has revealed the presence of a defect with a positron lifetime of ∼330 ps in samples in which the carrier concentration has saturated. This lifetime is attributed to a complex involving vacancies and Zn atoms. A model is proposed in which this complex has a (−/0) level near the bottom of the band gap, and undergoes a large inward lattice relaxation upon the transition to the neutral charge …
Authors
Mahony J; Mascher P; Puff W
Journal
Journal of Applied Physics, Vol. 80, No. 5, pp. 2712–2719
Publisher
AIP Publishing
Publication Date
September 1, 1996
DOI
10.1063/1.363188
ISSN
0021-8979