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Bonding Stress and Reliability of High Power...
Journal article

Bonding Stress and Reliability of High Power GaAs-Based Lasers

Abstract

GaAs-based lasers were bonded to oxygen-free high-conductivity (OFHC) copper heat sinks using a eutectic PbSn solder or a silver-filled conductive epoxy, and life tested. Epoxy-bonded devices were observed to have a larger failure rate on life test than solder-bonded devices. Bonding stress, as measured by the degree of polarization (DOP) of photoluminescence, was found to be the largest in epoxy-bonded devices. As well, the type of heat sink …

Authors

Lisak D; Cassidy DT; Moore AH

Journal

IEEE Transactions on Components Packaging and Manufacturing Technology, Vol. 24, No. 1,

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

March 2001

DOI

10.1109/6144.910807

ISSN

2156-3950