Effects of having two populations of defects growing in the cavity of a semiconductor laser

In this study, we show the effects of the growth of two noninteracting populations of defects in the cavity of a semiconductor laser diode, induced by accelerated lifetesting. The development of one type of defect is considered to give rise to a particular failure mode or mechanism. Using a multicomponent model, we demonstrate that the evolution of the threshold current as a function of time is strongly affected by the operating temperature. We …