Journal article
Si core-level excitation of hexamethyldisilane studied by synchrotron radiation and multiple-scattering X α calculation
Abstract
The Si 1s, Si 2s and Si 2p core-level photoabsorption spectra of hexamethyldisilane have been recorded by synchrotron radiation and calculated by the multiple-scattering (MS) X α method. The results of the calculation are in semiquantitative agreement with the experimental spectra. The relative intensity of corresponding transitions at the (1s, 2s) or (2p) edges differs greatly on account of atomic-like propensity rules (s → p, p → s, d). …
Authors
Xiong JZ; Jiang DT; Liu ZF; Baines KM; Sham TK; Urquhart SG; Wen AT; Tyliszczak T; Hitchcock AP
Journal
Chemical Physics, Vol. 203, No. 1, pp. 81–92
Publisher
Elsevier
Publication Date
February 1996
DOI
10.1016/0301-0104(95)00353-3
ISSN
0301-0104