Journal article
Radiation damage in soft X-ray microscopy
Abstract
The rates of chemical transformation by radiation damage of polystyrene (PS), poly(methyl methacrylate) (PMMA), and fibrinogen (Fg) in a X-ray photoemission electron microscope (X-PEEM) and in a scanning transmission X-ray microscope (STXM) have been measured quantitatively using synchrotron radiation. As part of the method of dose evaluation in X-PEEM, the characteristic (1/e) sampling depth of X-PEEM for polystyrene in the C 1s region was …
Authors
Wang J; Morin C; Li L; Hitchcock AP; Scholl A; Doran A
Journal
Journal of Electron Spectroscopy and Related Phenomena, Vol. 170, No. 1-3, pp. 25–36
Publisher
Elsevier
Publication Date
March 2009
DOI
10.1016/j.elspec.2008.01.002
ISSN
0368-2048