Journal article
Optimization of analysis of soft X-ray spectromicroscopy at the Ca 2p edge
Abstract
Authors
Hanhan S; Smith AM; Obst M; Hitchcock AP
Journal
Journal of Electron Spectroscopy and Related Phenomena, Vol. 173, No. 1, pp. 44ā49
Publisher
Elsevier
Publication Date
June 1, 2009
DOI
10.1016/j.elspec.2009.04.010
ISSN
0368-2048