authors
- Cao, W
- Masnadi, M
- Eger, S
- Martinson, M
- Xiao, Q-F
- Hu, Y-F
- Baribeau, J-M
- Woicik, JC
- Hitchcock, Adam Percival
- Urquhart, SG
Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films
Journal Articles
- Overview
- Research
- Identity
- Additional Document Info
- View All
Overview
status
publication date
- January 2013
has subject area
- Applied Physics (Science Metrix)
published in
- Applied Surface Science Journal