Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films Academic Article uri icon

  •  
  • Overview
  •  
  • Research
  •  
  • Identity
  •  
  • Additional Document Info
  •  
  • View All
  •  

authors

  • Cao, W
  • Masnadi, M
  • Eger, S
  • Martinson, M
  • Xiao, Q-F
  • Hu, Y-F
  • Baribeau, J-M
  • Woicik, JC
  • Hitchcock, Adam Percival
  • Urquhart, SG

publication date

  • January 2013