Journal article
Soft X-ray microscopy and spectroscopy at the molecular environmental science beamline at the Advanced Light Source
Abstract
Authors
Bluhm H; Andersson K; Araki T; Benzerara K; Brown GE; Dynes JJ; Ghosal S; Gilles MK; Hansen H-C; Hemminger JC
Journal
Journal of Electron Spectroscopy and Related Phenomena, Vol. 150, No. 2-3, pp. 86–104
Publisher
Elsevier
Publication Date
February 1, 2006
DOI
10.1016/j.elspec.2005.07.005
ISSN
0368-2048