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Ion-beam mixing of Ni/Pd layers: I. Cascade mixing...
Journal article

Ion-beam mixing of Ni/Pd layers: I. Cascade mixing regime (low temperature)

Abstract

A tomic mixing resulting from heavy-ion bombardment of thin-film Ni/Pd bilayers and thin Pd markers sandwiched between Ni layers has been investigated. Mixing experiments were performed over a temperature range 40–473 K, using 120 keV Ar+ and 145 keV Kr+ ions at a constant dose rate of 5.5 × 1012 ions cm −2s−1 for doses up to 4 × 1016cm−2. The resulting interdiffusion was measured, in situ, using Rutherford backscattering with 2−2.8 MeV 4He+ …

Authors

Akano UG; Thompson DA; Davies JA; Smeltzer WW

Journal

Journal of Materials Research, Vol. 3, No. 6, pp. 1057–1062

Publisher

Springer Nature

Publication Date

11 1988

DOI

10.1557/jmr.1988.1057

ISSN

0884-2914