Journal article
A Space Mapping Methodology for Defect Characterization from Magnetic Flux Leakage Measurements
Abstract
Authors
Amineh RK; Koziel S; Nikolova NK; Bandler JW; Reilly JP
Journal
IEEE Transactions on Magnetics, Vol. 44, No. 8, pp. 2058–2065
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
August 1, 2008
DOI
10.1109/tmag.2008.923228
ISSN
0018-9464