Standardization of line‐scan NIR imaging systems Journal Articles

abstract

• AbstractA simple and easy to use method is proposed for standardizing NIR imaging systems for differences among detectors in the charge‐coupled device (CCD) array and illumination unevenness. The standardization equations are then used to pre‐treat NIR image data to reduce the systematic errors introduced by a line‐scan NIR imaging system. The method requires only easily available homogeneous standards with relatively uniform spectral response. The effectiveness of the standardization in reducing the pixel‐to‐pixel biases and other systematic effects is illustrated with examples, and the improved sensitivity in results obtained from a multivariate image analysis (MIA) based on multi‐way principal component analysis (MPCA) is demonstrated. Copyright © 2007 John Wiley & Sons, Ltd.

authors

• Liu, Zheng
• Yu, Honglu
• Macgregor, John Frederick

status

• published 

publication date

• March 2007

has subject area

• 0301 Analytical Chemistry (FoR)
• Analytical Chemistry (Science Metrix)

published in

• Journal of Chemometrics  Journal

keywords

• Automation & Control Systems
• CALIBRATION
• Chemistry
• Chemistry, Analytical
• Computer Science
• Computer Science, Artificial Intelligence
• Instruments & Instrumentation
• Mathematics
• Mathematics, Interdisciplinary Applications
• Physical Sciences
• Science & Technology
• Statistics & Probability
• Technology
• hyperspectral images
• instrument standardization
• line-scan NIR imaging

Digital Object Identifier (DOI)

• 10.1002/cem.1038

start page

• 88

end page

• 95

volume

• 21

issue

• 3-4