authors
- Aebi, P
- Tyliszczak, T
- Hitchcock, Adam Percival
- Baines, KM
- Sham, TK
- Jackman, TE
- Baribeau, J-M
- Lockwood, DJ
Simultaneous analysis of multiple extended x-ray-absorption fine-structure spectra: Application to studies of buried Ge-Si interfaces
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