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Enabling Gate Dielectric Design for All...
Journal article

Enabling Gate Dielectric Design for All Solution-Processed, High-Performance, Flexible Organic Thin-Film Transistors

Abstract

A novel solution-processed, compositionally and structurally stable dual-layer gate dielectric composed of a UV-cured poly(4-vinyl phenol)-co-poly(methyl methacrylate) bottom layer and a thermally cross-linked poly(methyl silsesquioxane) top layer for organic thin-film transistors is described. This gate dielectric design, coupled with compatible solution-processable semiconductor and conductor materials, has enabled fabrication of all …

Authors

Liu P; Wu Y; Li Y; Ong BS; Zhu S

Journal

Journal of the American Chemical Society, Vol. 128, No. 14, pp. 4554–4555

Publisher

American Chemical Society (ACS)

Publication Date

April 1, 2006

DOI

10.1021/ja060620l

ISSN

0002-7863