Journal article
Enabling Gate Dielectric Design for All Solution-Processed, High-Performance, Flexible Organic Thin-Film Transistors
Abstract
A novel solution-processed, compositionally and structurally stable dual-layer gate dielectric composed of a UV-cured poly(4-vinyl phenol)-co-poly(methyl methacrylate) bottom layer and a thermally cross-linked poly(methyl silsesquioxane) top layer for organic thin-film transistors is described. This gate dielectric design, coupled with compatible solution-processable semiconductor and conductor materials, has enabled fabrication of all …
Authors
Liu P; Wu Y; Li Y; Ong BS; Zhu S
Journal
Journal of the American Chemical Society, Vol. 128, No. 14, pp. 4554–4555
Publisher
American Chemical Society (ACS)
Publication Date
April 1, 2006
DOI
10.1021/ja060620l
ISSN
0002-7863