WAVE-BASED APPROACH FOR MICROWAVE NOISE CHARACTERIZATION

The noise behavior of a two-port is usually described through the conventional set of noise parameters F min , R n , and the complex Y opt . However, noise parameters developed using wave-based techniques also have their merit as they could offer different insights to a two-port's noise behavior. Unlike the conventional noise parameters, these wave-based noise parameters could be terminal-invariant and describe only the intrinsic noise behavior of a two-port. In this paper, several important noise parameters derived from wave-based approaches are reviewed. The derivation of each set of parameters is discussed and illustrated. The measurement approach of each set of parameters is also briefly covered.