WAVE-BASED APPROACH FOR MICROWAVE NOISE CHARACTERIZATION Journal Articles

abstract

• The noise behavior of a two-port is usually described through the conventional set of noise parameters Fmin, Rn, and the complex Yopt. However, noise parameters developed using wave-based techniques also have their merit as they could offer different insights to a two-port's noise behavior. Unlike the conventional noise parameters, these wave-based noise parameters could be terminal-invariant and describe only the intrinsic noise behavior of a two-port. In this paper, several important noise parameters derived from wave-based approaches are reviewed. The derivation of each set of parameters is discussed and illustrated. The measurement approach of each set of parameters is also briefly covered.

authors

• Chen, Chih-hung
• WANG, YL
• Bakr, Mohamed

status

• published 

publication date

• March 2008

has subject area

• Fluids & Plasmas (Science Metrix)

published in

• Fluctuation and Noise Letters  Journal

keywords

• 2-PORTS
• ACCURATE
• CHANNEL NOISE
• EXTRACTION
• HIGH-FREQUENCY NOISE
• MOSFETS
• Mathematics
• Mathematics, Interdisciplinary Applications
• PARAMETERS
• Physical Sciences
• Physics
• Physics, Applied
• Science & Technology
• TRANSISTOR
• noise characterization
• noise parameters
• noise wave

Digital Object Identifier (DOI)

• 10.1142/s0219477508004313

start page

• R1

end page

• R14

volume

• 08

issue

• 01