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Using 4D-STEM and TKD as Complementary Techniques...
Journal article

Using 4D-STEM and TKD as Complementary Techniques for Nanocrystals Orientation Mapping

Authors

Yip KM; Ohl M; Ozsoy-Keskinbora C; Lazar S

Journal

Microscopy and Microanalysis, Vol. 31, No. Supplement_1,

Publisher

Oxford University Press (OUP)

Publication Date

July 25, 2025

DOI

10.1093/mam/ozaf048.296

ISSN

1431-9276

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