Focus to generalize (F2G): physics-guided attention for sample efficient and generalizable deep learning defect detection
Journal Articles
-
- Overview
-
- Research
-
- Identity
-
- View All
-
Overview
publication date
has subject area
published in
Research
keywords
-
Additive manufacturing
-
Attention
-
Computer Science
-
Computer Science, Artificial Intelligence
-
DEPOSITION
-
Deep learning
-
Engineering
-
Engineering, Manufacturing
-
Generalization
-
HIGH-POWER
-
Humping
-
Monitoring
-
PREDICTION
-
Science & Technology
-
TIME
-
Technology
Identity
Digital Object Identifier (DOI)