Chapter 13 Summary and future directions ⍟ ⍟ This book has a companion website hosting complementary materials. Visit this URL to access it: https://data.mendeley.com/datasets/879xmdz3d8/1.

Recently, considerable work has been carried out on one-shot device data analysis from accelerated life testing (ALT) experiments. In this book, we have synthesized all recent results on robust inference for one-shot device testing. In this chapter, we summarize the results presented in all the preceding chapters and then describe some future problems that may be worth studying.