Chapter 7 Robust inference under the lognormal distribution ⍟ ⍟ This book has a companion website hosting complementary materials. Visit this URL to access it: https://data.mendeley.com/datasets/879xmdz3d8/1.

In this chapter, we introduce a family of robust estimators and Wald-type tests based on the density power divergence (DPD) measure for one-shot device testing under constant-stress accelerated life tests (CSALTs), with a single failure mode and lifetimes following the lognormal distribution. These DPD-based estimators and Wald-type tests include the maximum likelihood estimator (MLE) and the classical Wald test, respectively, as a particular case. We prove the robustness of the proposed statistics through the study of their influence functions (IFs) and also by means of an extensive simulation study. We conclude the chapter with a numerical example on glass-capacitors data, illustrating the practical utility of the proposed methods.