Chapter 1 Introduction ⍟ ⍟ This book has a companion website hosting complementary materials. Visit this URL to access it: https://data.mendeley.com/datasets/879xmdz3d8/1.

In recent times, the analysis of data from one-shot device testing has emerged as a significant area of interest in reliability theory and practice. In this chapter, we present a comprehensive review of one-shot device testing data collected from accelerated life tests (ALTs). Several examples are provided as illustrations of the many diverse applications of one-shot device testing both in reliability and survival analyses.