Investigation of terbium-doped silicon oxide thin films: comparison of TEM images prepared by FIB and mechanical methods
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Overview
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Research
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EMISSION
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Engineering
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Engineering, Electrical & Electronic
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Materials Science
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Materials Science, Multidisciplinary
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Physical Sciences
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Physics
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Physics, Condensed Matter
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Science & Technology
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Technology
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damage of focused ion beam
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photoluminescence
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silicon thin film
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transmission electron microscopy
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