Investigation of terbium-doped silicon oxide thin films: comparison of TEM images prepared by FIB and mechanical methods
Journal Articles
- Overview
- Research
- Identity
- Additional Document Info
- View All
Overview
status
publication date
- May 30, 2025
has subject area
- 0204 Condensed Matter Physics (FoR)
- 0906 Electrical and Electronic Engineering (FoR)
- 0912 Materials Engineering (FoR)
- Applied Physics (Science Metrix)