Journal article
An Embedded Architecture for DDR5 DFE Calibration Based on Channel Stimulus Inversion
Abstract
Authors
Cooke M; Nicolici N
Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 33, No. 3, pp. 793–806
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2025
DOI
10.1109/tvlsi.2024.3505835
ISSN
1063-8210