Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring

Accelerated life test provides a feasible and effective way to rapidly derive lifetime information by exposing products to higher-than-normal operating conditions. However, most of the previous research on accelerated life test has focused on the application of a single stress factor and a traditional censoring scheme. This article considers the reliability inference for a dual constant-stress accelerated life test model with exponential …