Journal article
Generative and Contrastive Combined Support Sample Synthesis Model for Few-/Zero-Shot Surface Defect Recognition
Abstract
Authors
Dong Y; Xie C; Xu L; Cai H; Shen W; Tang H
Journal
IEEE Transactions on Instrumentation and Measurement, Vol. 73, , pp. 1–15
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2024
DOI
10.1109/tim.2023.3329163
ISSN
0018-9456