Journal article
Codes for Asymmetric Limited-Magnitude Errors with Application to Multilevel Flash Memories
Abstract
Authors
Cassuto Y; Schwartz M; Bohossian V; Bruck J
Journal
IEEE Transactions on Information Theory, Vol. 56, No. 4, pp. 1582–1595
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
April 1, 2010
DOI
10.1109/tit.2010.2040971
ISSN
0018-9448