Preprint
A piecewise thickness-function to the interferometric measurement of the optically transparent thin films
Abstract
A new piecewise thickness-function to determine the thickness of extremely transparent thin films, through the monochromatic-light-interferometric data, is proposed. The piecewise thickness-function is based on the gray values interference patterns, studied as a piecewise function as well. In the gray value piecewise function each subfunction corresponds to an interferometric branch, which is related to reflectivity from where a new rescaled …
Authors
Gasca-Figueroa D; García-Rodríguez FJ; Castro-Beltrán R; Perez-Pinal FJ; Vélez-García RD; Gutiérrez-Juárez G
DOI
10.21203/rs.3.rs-3204553/v1
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