Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks

Data obtained from destructive one-shot devices are usually studied through a binary response variable indicating failure or success of the device. But, in many practical situations, it may be more realistic to consider that the failure of the device may be due to several competing risks. In this paper, we develop divergence-based inference for one-shot device testing under Weibull lifetimes. This inference is shown to be more robust than the classical MLE-based inference, without a significant loss in efficiency when the data arise from the true model. A detailed simulation study is done to show the behaviour of the proposed estimation method and the associated inference. Finally, the developed methods are applied to a motor insulation dataset for illustrative purposes.