Atomic-Scale Imaging of Organic-Inorganic Hybrid Perovskite Using Transmission Electron Microscope

Transmission electron microscope (TEM) is thought as one powerful tool to imaging the atomic-level structure of organic inorganic hybrid perovskite (OIHP) materials, which provides valuable and essential guidance toward high performance OIHP-related devices. However, these OIHPs exhibit poor electron beam stability, severely limiting their practical applications in TEM. Here in this article, the application of TEM to obtain atomic-scale image of OIHPs, main obstacles in identifying the degradation product and future prospects of TEM in the characterization of OIHP materials are reviewed and presented. Three potential strategies (sample protection, low temperature technology, and low-dose technologies) are also proposed to overcome the current drawback of TEM technology.