Journal article
Analysis of X-ray images and spectra (aXis2000): A toolkit for the analysis of X-ray spectromicroscopy data
Abstract
Authors
Hitchcock AP
Journal
Journal of Electron Spectroscopy and Related Phenomena, Vol. 266, ,
Publisher
Elsevier
Publication Date
July 1, 2023
DOI
10.1016/j.elspec.2023.147360
ISSN
0368-2048