Electrical Characterization of Semiconductor Materials and Devices
Chapters
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- Overview
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- Research
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- Identity
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- Additional Document Info
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- View All
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Overview
Research
keywords
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CHARGE
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DEEP-LEVEL
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DENSITY
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INTERFACE
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LEVEL TRANSIENT SPECTROSCOPY
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LOW-FREQUENCY NOISE
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MOSFETS
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Materials Science
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Materials Science, Multidisciplinary
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OXIDE
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PLANAR SEPARATE ABSORPTION
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Physical Sciences
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Physics
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Physics, Applied
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RESISTANCE
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Science & Technology
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Technology
Identity
Digital Object Identifier (DOI)
International Standard Book Number (ISBN) 13
Additional Document Info