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Journal article

Sequential environmental stresses tests qualification for automotive components

Abstract

The purpose is to create a new qualification methodology for plastic encapsulated electronic components used in an automotive environment at high temperature. It is based on the acceleration of failure mechanisms like ball bond lift (due to intermetallic Au–Al thickness growth), by combination of environmental stresses. The delamination measurement was used as an indicator of potential assembly weaknesses. An optimized package sequential qualification test flow is proposed.

Authors

Bahi MA; Lecuyer P; Fremont H; Landesman J-P

Journal

Microelectronics Reliability, Vol. 47, No. 9-11, pp. 1680–1684

Publisher

Elsevier

Publication Date

September 1, 2007

DOI

10.1016/j.microrel.2007.07.004

ISSN

0026-2714

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