Journal article
Sequential environmental stresses tests qualification for automotive components
Abstract
Authors
Bahi MA; Lecuyer P; Fremont H; Landesman J-P
Journal
Microelectronics Reliability, Vol. 47, No. 9-11, pp. 1680–1684
Publisher
Elsevier
Publication Date
September 1, 2007
DOI
10.1016/j.microrel.2007.07.004
ISSN
0026-2714