Home
Scholarly Works
Finite size scaling in Ising thin films
Journal article

Finite size scaling in Ising thin films

Abstract

The Curie temperature of Ising thin films with various crystalline structures and surface orientations is calculated within the Bragg-Williams and the Bethe approximations. Tc is calculated as a function of the number of layers N and the scaling relation Δτ = 1 - Tc(N)Tc(∞) = AN−λ is obtained. It is analyzed in detail how the coefficient A and the exponent λ depend on the approximation used, on the crystalline structure, on the ratio between the surface and bulk coordination numbers, and how they tend to the asymptotic values.

Authors

Díaz-Ortiz A; Aguilera-Granja F; Morán-López JL

Journal

Solid State Communications, Vol. 91, No. 6, pp. 435–438

Publisher

Elsevier

Publication Date

August 1, 1994

DOI

10.1016/0038-1098(94)90780-3

ISSN

0038-1098

Contact the Experts team