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Electrical Stressing Induced Monolayer Vacancy...
Preprint

Electrical Stressing Induced Monolayer Vacancy Island Growth on TiSe2

Abstract

To ensure the practical application of atomically thin transition metal dichalcogenides, it is essential to characterize their structural stability

Authors

Zheng H; Valtierra S; Ofori-Opoku N; Chen C; Sun L; Jiao L; Bevan KH; Tao C

Publication date

June 15, 2017

DOI

10.48550/arxiv.1706.05096

Preprint server

arXiv